Threshold Voltage Instability in p-GaN Gate AlGaN/GaN HFETs

Published 2018 View Full Article

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Title
Threshold Voltage Instability in p-GaN Gate AlGaN/GaN HFETs
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 65, Issue 6, Pages 2454-2460
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2018-04-28
DOI
10.1109/ted.2018.2828702

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