Electrical and optical characterization of SiO x N y and SiO 2 dielectric layers and rear surface passivation by using SiO 2 /SiO x N y stack layers with screen printed local Al-BSF for c-Si solar cells

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Title
Electrical and optical characterization of SiO x N y and SiO 2 dielectric layers and rear surface passivation by using SiO 2 /SiO x N y stack layers with screen printed local Al-BSF for c-Si solar cells
Authors
Keywords
-
Journal
CURRENT APPLIED PHYSICS
Volume 18, Issue 1, Pages 107-113
Publisher
Elsevier BV
Online
2017-10-13
DOI
10.1016/j.cap.2017.10.004

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