Structural characterization of off-stoichiometric kesterite-type Cu2ZnGeSe4 compound semiconductors: from cation distribution to intrinsic point defect density
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Title
Structural characterization of off-stoichiometric kesterite-type Cu2ZnGeSe4 compound semiconductors: from cation distribution to intrinsic point defect density
Authors
Keywords
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Journal
CRYSTENGCOMM
Volume 20, Issue 11, Pages 1491-1498
Publisher
Royal Society of Chemistry (RSC)
Online
2018-01-22
DOI
10.1039/c7ce02090b
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