Fast Bi-dimensional empirical mode decomposition as an image enhancement technique for fruit defect detection

Title
Fast Bi-dimensional empirical mode decomposition as an image enhancement technique for fruit defect detection
Authors
Keywords
-
Journal
COMPUTERS AND ELECTRONICS IN AGRICULTURE
Volume 152, Issue -, Pages 314-323
Publisher
Elsevier BV
Online
2018-07-21
DOI
10.1016/j.compag.2018.07.025

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