Diagnostics of Radiative Processes in Semiconductors, Excited by Ultrashort High-Voltage Pulses

Published 2018 View Full Article

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Title
Diagnostics of Radiative Processes in Semiconductors, Excited by Ultrashort High-Voltage Pulses
Authors
Keywords
measuring equipment, streak camera, streamer discharge, semiconductors, fiber-optic cables
Journal
Bulletin of the Lebedev Physics Institute
Volume 45, Issue 4, Pages 108-111
Publisher
Allerton Press
Online
2018-05-04
DOI
10.3103/s1068335618040036
References
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