XPS study of ion irradiated and unirradiated CeO 2 bulk and thin film samples

Published 2018 View Full Article

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Title
XPS study of ion irradiated and unirradiated CeO 2 bulk and thin film samples
Authors
Keywords
-
Journal
APPLIED SURFACE SCIENCE
Volume 448, Issue -, Pages 154-162
Publisher
Elsevier BV
Online
2018-04-11
DOI
10.1016/j.apsusc.2018.04.077

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