On the Accuracy of Elastic Strain Field Measurements by Laue Microdiffraction and High-Resolution EBSD: a Cross-Validation Experiment
Published 2015 View Full Article
- Home
- Publications
- Publication Search
- Publication Details
Title
On the Accuracy of Elastic Strain Field Measurements by Laue Microdiffraction and High-Resolution EBSD: a Cross-Validation Experiment
Authors
Keywords
Synchrotron radiation, HR-EBSD, Laue microdiffraction, Austenitic steel, Stainless steel, Laue-DIC
Journal
EXPERIMENTAL MECHANICS
Volume 56, Issue 3, Pages 483-492
Publisher
Springer Nature
Online
2015-12-12
DOI
10.1007/s11340-015-0114-1
References
Ask authors/readers for more resources
Related references
Note: Only part of the references are listed.- Determination of deviatoric elastic strain and lattice orientation by applying digital image correlation to Laue microdiffraction images: the enhanced Laue-DIC method
- (2015) F. G. Zhang et al. JOURNAL OF APPLIED CRYSTALLOGRAPHY
- Laue-DIC: a new method for improved stress field measurements at the micrometer scale
- (2015) J. Petit et al. JOURNAL OF SYNCHROTRON RADIATION
- Mapping type III intragranular residual stress distributions in deformed copper polycrystals
- (2013) Jun Jiang et al. ACTA MATERIALIA
- Submicrometre-resolution polychromatic three-dimensional X-ray microscopy
- (2012) B. C. Larson et al. JOURNAL OF APPLIED CRYSTALLOGRAPHY
- Assessment of deviatoric lattice strain uncertainty for polychromatic X-ray microdiffraction experiments
- (2012) Andrew Poshadel et al. JOURNAL OF SYNCHROTRON RADIATION
- High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations
- (2012) T.B. Britton et al. ULTRAMICROSCOPY
- Analysis of strain error sources in micro-beam Laue diffraction
- (2011) Felix Hofmann et al. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
- A new white beam x-ray microdiffraction setup on the BM32 beamline at the European Synchrotron Radiation Facility
- (2011) O. Ulrich et al. REVIEW OF SCIENTIFIC INSTRUMENTS
- High resolution surface morphology measurements using EBSD cross-correlation techniques and AFM
- (2011) M.D. Vaudin et al. ULTRAMICROSCOPY
- Towards high accuracy calibration of electron backscatter diffraction systems
- (2011) Ken Mingard et al. ULTRAMICROSCOPY
- On solving the orientation gradient dependency of high angular resolution EBSD
- (2011) Claire Maurice et al. ULTRAMICROSCOPY
- Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns
- (2010) T.B. Britton et al. ULTRAMICROSCOPY
- A method for accurate localisation of EBSD pattern centres
- (2010) Claire Maurice et al. ULTRAMICROSCOPY
- Accuracy assessment of elastic strain measurement by EBSD
- (2009) S. VILLERT et al. JOURNAL OF MICROSCOPY
- Tutorial on x-ray microLaue diffraction
- (2009) Gene E. Ice et al. MATERIALS CHARACTERIZATION
- Mapping mesoscale heterogeneity in the plastic deformation of a copper single crystal
- (2009) K.R. Magid et al. PHILOSOPHICAL MAGAZINE
- Polychromatic microdiffraction characterization of defect gradients in severely deformed materials
- (2008) Rozaliya I. Barabash et al. MICRON
Publish scientific posters with Peeref
Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.
Learn MoreBecome a Peeref-certified reviewer
The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.
Get Started