4.8 Article

Impact of Thickness on Contact Issues for Pinning Effect in Black Phosphorus Field-Effect Transistors

Journal

ADVANCED FUNCTIONAL MATERIALS
Volume 28, Issue 26, Pages -

Publisher

WILEY-V C H VERLAG GMBH
DOI: 10.1002/adfm.201801398

Keywords

black phosphorus; energy band calculation; pinning effect; Schottky barrier; thickness-dependent

Funding

  1. Hunan Province Natural Science Foundation [2017JJ3033]
  2. Hubei Province Natural Science Foundation [2016CFA028]
  3. Natural Science Foundation of Hunan Province [2017RS3021]
  4. 973 grant of Ministry of Science and Technology (MOST) [2013CBA01604]
  5. National Natural Science Foundation of China (NSFC) [61704051, U1632156, 61574101]
  6. Ten Thousand Talents Program for Young Talents

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Metal/semiconductor contact is a significant constraint in short-channel field effect transistors (FETs) comprising black phosphorus (BP) and other 2D semiconductors. Due to the pinning effect at metal/2D semiconductor interface, the Schottky barrier usually does not follow the Schottky-Mott rule, resulting in thickness-dependent FET performance. In this work, the Schottky barrier in BP FETs is investigated via theory calculation and electrical measurement. A simple metal/BP contact model is presented based upon thickness-dependent electrical characteristics of BP FETs. The model considers the Schottky barrier as a combined effect of the Schottky-Mott rule and the pinning effect and provides a feasibility to track the conducting behavior of other 2D semiconductor FETs.

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