On the origin of threading dislocations during epitaxial growth of III-Sb on Si(001): A comprehensive transmission electron tomography and microscopy study
On the origin of threading dislocations during epitaxial growth of III-Sb on Si(001): A comprehensive transmission electron tomography and microscopy study
Authors
Keywords
Dislocation structure, Antiphase boundary, Tomography, Transmission electron microscopy, Semiconductor heterostructures
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