Nanoscale characterization of bismuth telluride epitaxial layers by advanced X-ray analysis
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Title
Nanoscale characterization of bismuth telluride epitaxial layers by advanced X-ray analysis
Authors
Keywords
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Journal
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 50, Issue 2, Pages 399-410
Publisher
International Union of Crystallography (IUCr)
Online
2017-03-01
DOI
10.1107/s1600576717000760
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