4.3 Article

Twin domain imaging in topological insulator Bi2Te3 and Bi2Se3 epitaxial thin films by scanning X-ray nanobeam microscopy and electron backscatter diffraction

Journal

JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 50, Issue -, Pages 369-377

Publisher

INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S1600576717000565

Keywords

twinning; electron backscatter diffraction; scanning X-ray diffraction; topological insulators

Funding

  1. Czech Science Foundation [14-08124S, GB14-36566G]
  2. Austrian Science Fund (FWF) [J3523-N27, SFB-025(IRON)]

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The twin distribution in topological insulators Bi2Te3 and Bi2Se3 was imaged by electron backscatter diffraction (EBSD) and scanning X-ray diffraction microscopy (SXRM). The crystal orientation at the surface, determined by EBSD, is correlated with the surface topography, which shows triangular pyramidal features with edges oriented in two different orientations rotated in the surface plane by 60 degrees. The bulk crystal orientation is mapped out using SXRM by measuring the diffracted X-ray intensity of an asymmetric Bragg peak using a nano-focused X-ray beam scanned over the sample. By comparing bulk-and surface-sensitive measurements of the same area, buried twin domains not visible on the surface are identified. The lateral twin domain size is found to increase with the film thickness.

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