Near-Field Imaging of Free Carriers in ZnO Nanowires with a Scanning Probe Tip Made of Heavily Doped Germanium

Title
Near-Field Imaging of Free Carriers in ZnO Nanowires with a Scanning Probe Tip Made of Heavily Doped Germanium
Authors
Keywords
-
Journal
Physical Review Applied
Volume 8, Issue 5, Pages -
Publisher
American Physical Society (APS)
Online
2017-11-22
DOI
10.1103/physrevapplied.8.054042

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