Journal
MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS
Volume 224, Issue -, Pages 181-189Publisher
ELSEVIER
DOI: 10.1016/j.mseb.2017.08.002
Keywords
Electrodeposition; Thin film; Cadmium sulfide; Morphology; Band gap; Conductivity
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In this study, high-quality nanocrystalline CdS films are prepared on fluorine doped tin oxide (FTO) FTO/glass substrates by' electrodeposition method. The properties of annealed CdS film are optimized for estimating required thickness and nano-sized grain morphology with better optoelectronic attributes at optimum growth voltages. Field emission SEM images indicate CdS films with compact and nanosized grains are obtained even after a long deposition time at optimized growth voltages. X-ray diffraction reveals the films are polycrystalline in nature with a hexagonal wurtzite structure. CdS layer thickness is obtained by cross-sectional SEM images and compared with estimates from weight gain measurements and Faraday equation. Thicknesses of about 70-100 nm within 75-120 s are obtained. Energy dispersive X-ray (EDX) analyses for elemental analysis indicate very pure CdS layers. UV-Vis spectroscopy is applied to calculate the band gap. The sheet resistance of the films is also measured by four-point probe method.
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