Empirical Sensitivity Analysis of Discretization Parameters for Fault Pattern Extraction From Multivariate Time Series Data

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Title
Empirical Sensitivity Analysis of Discretization Parameters for Fault Pattern Extraction From Multivariate Time Series Data
Authors
Keywords
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Journal
IEEE Transactions on Cybernetics
Volume 47, Issue 5, Pages 1198-1209
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2016-03-31
DOI
10.1109/tcyb.2016.2540657

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