Degradation of Crystalline Silicon Due to Boron–Oxygen Defects

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Title
Degradation of Crystalline Silicon Due to Boron–Oxygen Defects
Authors
Keywords
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Journal
IEEE Journal of Photovoltaics
Volume 7, Issue 1, Pages 383-398
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2016-10-25
DOI
10.1109/jphotov.2016.2614119

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