Bipolar resistive switching behavior in Cu/AlN/Pt structure for ReRAM application

Published 2017 View Full Article

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Title
Bipolar resistive switching behavior in Cu/AlN/Pt structure for ReRAM application
Authors
Keywords
Electrical properties, Thin film, Sputtering
Journal
VACUUM
Volume 143, Issue -, Pages 102-105
Publisher
Elsevier BV
Online
2017-06-02
DOI
10.1016/j.vacuum.2017.05.041

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