Hybrid statistics-simulations based method for atom-counting from ADF STEM images

Published 2017 View Full Article

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Title
Hybrid statistics-simulations based method for atom-counting from ADF STEM images
Authors
Keywords
Annular dark field scanning transmission electron microscopy (ADF STEM), Statistical parameter estimation theory, Atom-counting, Beam-sensitive nanomaterials
Journal
ULTRAMICROSCOPY
Volume 177, Issue -, Pages 69-77
Publisher
Elsevier BV
Online
2017-01-25
DOI
10.1016/j.ultramic.2017.01.010

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