Fast and reliable pre-approach for scanning probe microscopes based on tip-sample capacitance

Title
Fast and reliable pre-approach for scanning probe microscopes based on tip-sample capacitance
Authors
Keywords
Capacitance measurements, Scanning probe microscope, Scanning tunneling microscope, Nano-positioning, Stepping motor, Coarse approach
Journal
ULTRAMICROSCOPY
Volume 181, Issue -, Pages 61-69
Publisher
Elsevier BV
Online
2017-05-10
DOI
10.1016/j.ultramic.2017.05.009

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