Quantitative measurement of mean inner potential and specimen thickness from high-resolution off-axis electron holograms of ultra-thin layered WSe 2

Published 2017 View Full Article

Authors

Keywords

Transmission electron microscopy, Off-axis electron holography, Mean inner potential, Specimen thickness, Transition metal dichalcogenide, WSe, 2

Journal

ULTRAMICROSCOPY

Volume 178, Issue -, Pages 38-47

Publisher

Elsevier BV

Online

2016-07-31

DOI

10.1016/j.ultramic.2016.07.016

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