200 keV cold field emission source using carbon cone nanotip: Application to scanning transmission electron microscopy

Published 2017 View Full Article

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Title
200 keV cold field emission source using carbon cone nanotip: Application to scanning transmission electron microscopy
Authors
Keywords
-
Journal
ULTRAMICROSCOPY
Volume 182, Issue -, Pages 303-307
Publisher
Elsevier BV
Online
2017-08-10
DOI
10.1016/j.ultramic.2017.07.018

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