Statistical analysis of dislocations and dislocation boundaries from EBSD data

Published 2017 View Full Article

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Title
Statistical analysis of dislocations and dislocation boundaries from EBSD data
Authors
Keywords
Electron BackScatter Diffraction, Dislocations, Disorientation Gradient, Incidental Dislocation Boundaries, Geometrically Necessary Boundaries, Tantalum
Journal
ULTRAMICROSCOPY
Volume 179, Issue -, Pages 63-72
Publisher
Elsevier BV
Online
2017-04-14
DOI
10.1016/j.ultramic.2017.04.005

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