Measuring nanometre-scale electric fields in scanning transmission electron microscopy using segmented detectors

Published 2017 View Full Article

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Title
Measuring nanometre-scale electric fields in scanning transmission electron microscopy using segmented detectors
Authors
Keywords
Scanning transmission electron microscopy (STEM), Differential phase contrast (DPC) imaging, p, -, n, junctions, Electric fields
Journal
ULTRAMICROSCOPY
Volume 182, Issue -, Pages 169-178
Publisher
Elsevier BV
Online
2017-07-04
DOI
10.1016/j.ultramic.2017.07.002

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