High-throughput, semi-automated quantitative STEM mass measurement of supported metal nanoparticles using a conventional TEM/STEM

Published 2017 View Full Article

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Title
High-throughput, semi-automated quantitative STEM mass measurement of supported metal nanoparticles using a conventional TEM/STEM
Authors
Keywords
Quantitative STEM, HAADF, STEM, nanoparticles, Atom counting, Mass measurement
Journal
ULTRAMICROSCOPY
Volume 182, Issue -, Pages 145-155
Publisher
Elsevier BV
Online
2017-07-04
DOI
10.1016/j.ultramic.2017.07.004

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