High precision measurement of silicon in naphthas by ICP-OES using isooctane as diluent

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Title
High precision measurement of silicon in naphthas by ICP-OES using isooctane as diluent
Authors
Keywords
Silicon, Naphtha, Trace, ICP-OES, Isooctane
Journal
TALANTA
Volume 164, Issue -, Pages 563-569
Publisher
Elsevier BV
Online
2016-12-10
DOI
10.1016/j.talanta.2016.12.023

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