Electrothermal DC characterization of GaN on Si MOS-HEMTs

Published 2017 View Full Article

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Title
Electrothermal DC characterization of GaN on Si MOS-HEMTs
Authors
Keywords
AlGaN/GaN, MOS-HEMT on Si, Temperature, Thermal resistance, Self-heating, Numerical simulations
Journal
SOLID-STATE ELECTRONICS
Volume 137, Issue -, Pages 44-51
Publisher
Elsevier BV
Online
2017-08-09
DOI
10.1016/j.sse.2017.08.002

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