Review of radiation effects on ReRAM devices and technology

Published 2017 View Full Article

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Title
Review of radiation effects on ReRAM devices and technology
Authors
Keywords
-
Journal
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
Volume 32, Issue 8, Pages 083002
Publisher
IOP Publishing
Online
2017-07-04
DOI
10.1088/1361-6641/aa6124

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