Investigation of the deformation behavior of aluminum micropillars produced by focused ion beam machining using Ga and Xe ions

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Title
Investigation of the deformation behavior of aluminum micropillars produced by focused ion beam machining using Ga and Xe ions
Authors
Keywords
Ultrafine-grained aluminum, Focused ion beam, Micro-compression, Gallium
Journal
SCRIPTA MATERIALIA
Volume 127, Issue -, Pages 191-194
Publisher
Elsevier BV
Online
2016-09-21
DOI
10.1016/j.scriptamat.2016.08.028

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