System based on a ZVA-67 vector network analyzer for measuring high-frequency parameters of magnetic film structures

Title
System based on a ZVA-67 vector network analyzer for measuring high-frequency parameters of magnetic film structures
Authors
Keywords
thin magnetic films, magnetic field sensors, ferromagnetic resonance, microwave radiation, vector network analysis, EPR spectroscopy
Journal
RUSSIAN JOURNAL OF NONDESTRUCTIVE TESTING
Volume 53, Issue 3, Pages 204-212
Publisher
Pleiades Publishing Ltd
Online
2017-06-02
DOI
10.1134/s1061830917030093

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