Spectroscopic ellipsometry characterization of spin-coated Ge25S75 chalcogenide thin films

Published 2017 View Full Article

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Title
Spectroscopic ellipsometry characterization of spin-coated Ge25S75 chalcogenide thin films
Authors
Keywords
-
Journal
PURE AND APPLIED CHEMISTRY
Volume 89, Issue 4, Pages -
Publisher
Walter de Gruyter GmbH
Online
2017-01-20
DOI
10.1515/pac-2016-1019

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