4.5 Article

New fluorescent [Ag(I)(Schiff base)] complexes derived from 9-anthracenecarboxaldehyde and their application in thin layers deposition

Journal

POLYHEDRON
Volume 134, Issue -, Pages 177-191

Publisher

PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.poly.2017.06.019

Keywords

Schiff base; Fluorescence; Thin layer; NOE NMR; AFM

Funding

  1. National Science Centre Poland [2013/09/B/ST5/03509]

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New Ag(I) complexes with Schiff bases derived from 9-anthracenecarboxaldehyde and 2-thiopheneethy-lamine thet(9-anthraceneca) (L1) or (1R,2R)(+)-diphenylethylenediamine (1R,2R)(+)-diphenen(9-anthraceneca) (L2) were obtained and characterized by H-1, C-13, N-15 NMR, H-1 differential Nuclear Overhauser Effect (NOE cliff.) NMR technique, UV-Vis, CD and IR spectroscopy in solution and in the solid phase. X-ray crystal structure of [Ag(thet(9-anthraceneca))(2)]NO3] (1), revealed silver(I) linearly coordinated by the ligand imine nitrogen atoms. X-ray crystal structure detremination and DFT calculations for complexes and ligands, related confirming their geometry in solution and in the solid phase. H-1 NMR NOE cliff. spectra indicate that both Schiff bases adopt different conformation in solution and in the solid state. For Ag complexes with (L1) and (12) the significant NOE enhacement between the imine hydrogen atoms and hydrogen of the aromatic rings was observed, indicating changes of the silver ion coordination sphere in solution. The highest quantum yield of the fluorescence was achieved for (2) with phi(2) = 0.52 (lambda(ex) = 347 - nm). For all investigated compounds the fluorescence is related to the excitation HOMO -> LUMO + 1 or HOMO -> LUMO in the anthracene moiety. The homogeneous layers of complexes uniformly covering the silicon substrate have been obtained with a spin- or dip-coating techniques and characterized by scanning electron microscopy (SEM/EDS) and atomic force microscopy (AFM). The complex [Ag-2((1R,2R)(+)-diphenen(9-anthraceneca))(NO3)(2)] (2) was deposited on Si(111) covered with PMMA. Fluorescence spectra of [Ag(thet(9-anthraceneca))(2)]NO3] (1)/Si materials exhibit emission at 480 nm from intra-ligand transitions (lambda(ex) = 360 nm) and differ slightly from the spectra obtained for the solid complexes or their solutions. The highest fluorescence intensity was noted for the layers obtained by a multistage deposition at variable spin rates and deposition time 5 s. (C) 2017 Elsevier Ltd. All rights reserved.

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