X-ray Phase-Contrast Imaging and Metrology through Unified Modulated Pattern Analysis
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Title
X-ray Phase-Contrast Imaging and Metrology through Unified Modulated Pattern Analysis
Authors
Keywords
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Journal
PHYSICAL REVIEW LETTERS
Volume 118, Issue 20, Pages -
Publisher
American Physical Society (APS)
Online
2017-05-19
DOI
10.1103/physrevlett.118.203903
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