Charge distribution from SKPM images

Heterogeneity of surface potential in contact electrification under ambient conditions: A comparison of pre- and post-contact states

(2016) A.M. Barnes et al.   JOURNAL OF ELECTROSTATICS

Localized charge imaging with scanning Kelvin probe microscopy

(2016) M F Orihuela et al.   NANOTECHNOLOGY

Conducting polymers as electron glasses: surface charge domains and slow relaxation

(2016) Miguel Ortuño et al.   Scientific Reports

Dielectric charging by AFM in tip-to-sample space mode: overview and challenges in revealing the appropriate mechanisms

(2015) K Makasheva et al.   NANOTECHNOLOGY

Insights into Kelvin probe force microscopy data of insulator-supported molecules

(2015) Julia L. Neff et al.   PHYSICAL REVIEW B

Contact electrification of insulating materials

(2011) Daniel J Lacks et al.   JOURNAL OF PHYSICS D-APPLIED PHYSICS

Contrast inversion in electrostatic force microscopy imaging of trapped charges: tip–sample distance and dielectric constant dependence

(2011) C Riedel et al.   NANOTECHNOLOGY

The Mosaic of Surface Charge in Contact Electrification

(2011) H. T. Baytekin et al.   SCIENCE

Numerical simulations for a quantitative analysis of AFM electrostatic nanopatterning on PMMA by Kelvin force microscopy

(2010) E Palleau et al.   NANOTECHNOLOGY

AFM tip characterization by Kelvin probe force microscopy

(2010) C Barth et al.   NEW JOURNAL OF PHYSICS

Enhancing dynamic scanning force microscopy in air: as close as possible

(2009) E Palacios-Lidón et al.   NANOTECHNOLOGY

Some aspects of the polymers' electrostatic charging effects

(2008) Victoria Albrecht et al.   JOURNAL OF ELECTROSTATICS

Controlled positive and negative surface charge injection and erasure in a GaAs/AlGaAs based microdevice by scanning probe microscopy

(2008) G Valdrè et al.   NANOTECHNOLOGY