Discussion on accurate phase–height mapping in fringe projection profilometry

Title
Discussion on accurate phase–height mapping in fringe projection profilometry
Authors
Keywords
-
Journal
OPTICAL ENGINEERING
Volume 56, Issue 10, Pages 1
Publisher
SPIE-Intl Soc Optical Eng
Online
2017-10-26
DOI
10.1117/1.oe.56.10.104109

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