Contamination-free Ge-based graphene as revealed by graphene enhanced secondary ion mass spectrometry (GESIMS)

Published 2017 View Full Article

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Title
Contamination-free Ge-based graphene as revealed by graphene enhanced secondary ion mass spectrometry (GESIMS)
Authors
Keywords
-
Journal
NANOTECHNOLOGY
Volume 29, Issue 1, Pages 015702
Publisher
IOP Publishing
Online
2017-11-08
DOI
10.1088/1361-6528/aa98ed

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