Mechanical stress-induced switching kinetics of ferroelectric thin films at the nanoscale

Authors

Keywords

Journal

Volume 28, Issue 7, Pages 075709

Publisher

IOP Publishing

Online

2016-12-14

DOI

10.1088/1361-6528/aa536d

Explore over 38,000 international journals covering a vast array of academic fields.

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started