High Resolution Imaging of Short-Range Order Materials (Allophane) with Aberration Corrected TEM and Direct Electron Detection

Published 2017 View Full Article

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Title
High Resolution Imaging of Short-Range Order Materials (Allophane) with Aberration Corrected TEM and Direct Electron Detection
Authors
Keywords
-
Journal
MICROSCOPY AND MICROANALYSIS
Volume 23, Issue S1, Pages 2152-2153
Publisher
Cambridge University Press (CUP)
Online
2017-08-09
DOI
10.1017/s1431927617011424

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