Reducing Electron Beam Damage with Multipass Transmission Electron Microscopy

Published 2017 View Full Article

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Title
Reducing Electron Beam Damage with Multipass Transmission Electron Microscopy
Authors
Keywords
-
Journal
MICROSCOPY AND MICROANALYSIS
Volume 23, Issue S1, Pages 1794-1795
Publisher
Cambridge University Press (CUP)
Online
2017-08-09
DOI
10.1017/s1431927617009631

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