Carbon contamination in scanning transmission electron microscopy and its impact on phase-plate applications

Published 2017 View Full Article

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Title
Carbon contamination in scanning transmission electron microscopy and its impact on phase-plate applications
Authors
Keywords
Scanning transmission electron microscopy, Contamination, Electron-beam induced charging, Phase plate, Graphitized carbon, Thin film
Journal
MICRON
Volume 96, Issue -, Pages 38-47
Publisher
Elsevier BV
Online
2017-02-11
DOI
10.1016/j.micron.2017.02.002

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