Design of Testable Adder in Quantum‐dot Cellular Automata with Fault Secure Logic

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Title
Design of Testable Adder in Quantum‐dot Cellular Automata with Fault Secure Logic
Authors
Keywords
Quantum-dot cellular automata (QCA), QCA defects, Parity preserving logic, Testability, Nano-electronics
Journal
MICROELECTRONICS JOURNAL
Volume 60, Issue -, Pages 1-12
Publisher
Elsevier BV
Online
2016-12-22
DOI
10.1016/j.mejo.2016.11.008

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