High resolution tip-tilt positioning system for a next generation MLL-based x-ray microscope

Title
High resolution tip-tilt positioning system for a next generation MLL-based x-ray microscope
Authors
Keywords
-
Journal
MEASUREMENT SCIENCE and TECHNOLOGY
Volume 28, Issue 12, Pages 127001
Publisher
IOP Publishing
Online
2017-08-30
DOI
10.1088/1361-6501/aa8916

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