Fabric defect detection based on the saliency map construction of target-driven feature

Strip Steel Surface Defect Recognition Based on Novel Feature Extraction and Enhanced Least Squares Twin Support Vector Machine

(2014) Maoxiang Chu et al.   ISIJ INTERNATIONAL

Fabric defect image segmentation based on the visual attention mechanism of the wavelet domain

(2014) Shengqi Guan et al.   TEXTILE RESEARCH JOURNAL

Supervised defect detection on textile fabrics via optimal Gabor filter

(2013) Junfeng Jing et al.   Journal of Industrial Textiles

Bottom-Up and Top-Down Attention

(2013) Fumi Katsuki et al.   NEUROSCIENTIST

Fabric defect segmentation by bidimensional empirical mode decomposition

(2013) Zhengxin Li et al.   TEXTILE RESEARCH JOURNAL

Fabric defect detection using adaptive dictionaries

(2013) Jian Zhou et al.   TEXTILE RESEARCH JOURNAL

A computational model of vision attention for inspection of surface quality in production line

(2012) Guohui Li et al.   MACHINE VISION AND APPLICATIONS

Identification of twill grey fabric defects using DC suppressed Fourier power spectrum sum features

(2012) V Jayashree et al.   TEXTILE RESEARCH JOURNAL

Intelligent detection of defects of yarn-dyed fabrics by energy-based local binary patterns

(2012) Wenyu Li et al.   TEXTILE RESEARCH JOURNAL

Optimization of automated online fabric inspection by fast Fourier transform (FFT) and cross-correlation

(2012) Abdel Salam Malek et al.   TEXTILE RESEARCH JOURNAL

A Goal-Directed Visual Perception System Using Object-Based Top–Down Attention

(2011) Yuanlong Yu et al.   IEEE Transactions on Autonomous Mental Development

Familiarity based unified visual attention model for fast and robust object recognition

(2009) Seungjin Lee et al.   PATTERN RECOGNITION

Performance Evaluation for Motif-Based Patterned Texture Defect Detection

(2008) H.Y.T. Ngan et al.   IEEE Transactions on Automation Science and Engineering

Computer-Vision-Based Fabric Defect Detection: A Survey

(2008) A. Kumar   IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS

Defect detection in periodically patterned surfaces using independent component analysis

(2008) Du-Ming Tsai et al.   PATTERN RECOGNITION