A theoretical analysis on cloning the failed test cases to improve spectrum-based fault localization

Title
A theoretical analysis on cloning the failed test cases to improve spectrum-based fault localization
Authors
Keywords
Software debugging, Fault localization, Class imbalance, Test suite cloning
Journal
JOURNAL OF SYSTEMS AND SOFTWARE
Volume 129, Issue -, Pages 35-57
Publisher
Elsevier BV
Online
2017-04-25
DOI
10.1016/j.jss.2017.04.017

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