4.5 Review

Non-contact lateral force microscopy

Journal

JOURNAL OF PHYSICS-CONDENSED MATTER
Volume 29, Issue 32, Pages -

Publisher

IOP PUBLISHING LTD
DOI: 10.1088/1361-648X/aa7984

Keywords

atomic force microscopy; scanning probe microscopy; lateral force microscopy; surface science

Funding

  1. Deutsche Forschungsgemeinschaft [GRK 1570]

Ask authors/readers for more resources

The goal of atomic force microscopy (AFM) is to measure the short-range forces that act between the tip and the surface. The signal recorded, however, includes long-range forces that are often an unwanted background. Lateral force microscopy (LFM) is a branch of AFM in which a component of force perpendicular to the surface normal is measured. If we consider the interaction between tip and sample in terms of forces, which have both direction and magnitude, then we can make a very simple yet profound observation: over a flat surface, long-range forces that do not yield topographic contrast have no lateral component. Short-range interactions, on the other hand, do. Although contact-mode is the most common LFM technique, true non-contact AFM techniques can be applied to perform LFM without the tip depressing upon the sample. Non-contact lateral force microscopy (nc-LFM) is therefore ideal to study short-range forces of interest. One of the first applications of nc-LFM was the study of non-contact friction. A similar setup is used in magnetic resonance force microscopy to detect spin flipping. More recently, nc-LFM has been used as a true microscopy technique to systems unsuitable for normal force microscopy.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.5
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

Article Physics, Multidisciplinary

A Fourier method for estimating potential energy and lateral forces from frequency-modulation lateral force microscopy data

T. Seeholzer, O. Gretz, F. J. Giessibl, A. J. Weymouth

NEW JOURNAL OF PHYSICS (2019)

Article Nanoscience & Nanotechnology

Ion mobility and material transport on KBr in air as a function of the relative humidity

Dominik J. Kirpal, Korbinian Puerckhauer, Alfred J. Weymouth, Franz J. Giessibl

BEILSTEIN JOURNAL OF NANOTECHNOLOGY (2019)

Article Physics, Multidisciplinary

High-precision atomic force microscopy with atomically-characterized tips

A. Liebig, A. Peronio, D. Meuer, A. J. Weymouth, F. J. Giessibl

NEW JOURNAL OF PHYSICS (2020)

Article Physics, Multidisciplinary

Strumming a Single Chemical Bond

Alfred J. Weymouth, Elisabeth Riegel, Oliver Gretz, Franz J. Giessibl

PHYSICAL REVIEW LETTERS (2020)

Article Multidisciplinary Sciences

Quantifying the evolution of atomic interaction of a complex surface with a functionalized atomic force microscopy tip

Alexander Liebig, Prokop Hapala, Alfred J. Weymouth, Franz J. Giessibl

SCIENTIFIC REPORTS (2020)

Article Chemistry, Multidisciplinary

Lateral Force Microscopy Reveals the Energy Barrier of a Molecular Switch

Alfred John Weymouth, Elisabeth Riegel, Bianca Simmet, Oliver Gretz, Franz J. Giessibl

Summary: The research shows that on the surfaces of Cu(111) and Ag(111), even without inelastic events, the presence of the tip can induce rotations of CuPc molecules, and closer approach results in the rotated states being favored. Additionally, the long-range attraction of the tip can change the potential energy landscape of the CuPc molecular switch, and the geometry of the rotated and ground states of CuPc differs on Cu(111) and Ag(111).

ACS NANO (2021)

Article Instruments & Instrumentation

Biaxial atomically resolved force microscopy based on a qPlus sensor operated simultaneously in the first flexural and length extensional modes

Dominik Kirpal, Jinglan Qiu, Korbinian Puerckhauer, Alfred J. Weymouth, Michael Metz, Franz J. Giessibl

Summary: This study demonstrates the use of a qPlus sensor in atomic force microscopy to achieve atomic resolution in various environments, and shows how any qPlus AFM setup can be modified to work as a biaxial sensor for simultaneous measurement of lateral and vertical force components.

REVIEW OF SCIENTIFIC INSTRUMENTS (2021)

Article Nanoscience & Nanotechnology

Determining amplitude and tilt of a lateral force microscopy sensor

Oliver Gretz, Alfred J. Weymouth, Thomas Holzmann, Korbinian Purckhauer, Franz J. Giessibl

Summary: In lateral force microscopy, utilizing the scanning tunneling microscopy channel for acquiring amplitude and tilt data provides a more accurate and reliable method.

BEILSTEIN JOURNAL OF NANOTECHNOLOGY (2021)

Review Physics, Applied

Measuring sliding friction at the atomic scale

Alfred J. Weymouth, Oliver Gretz, Elisabeth Riegel, Franz J. Giessibl

Summary: In this study, we used lateral force microscopy to investigate the energy dissipation in sliding friction. We found that the CO molecule on the tip bends in different directions as it oscillates over pairs of atoms, leading to energy dissipation. Surprisingly, friction was observed only within a specific range of tip heights, indicating the sensitivity of friction to the local potential energy landscape.

JAPANESE JOURNAL OF APPLIED PHYSICS (2022)

Article Physics, Multidisciplinary

Evidence for temporary and local transition of sp(2) graphite-type to sp(3) diamond-type bonding induced by the tip of an atomic force microscope

Thomas Hofmann, Xinguo Ren, Alfred J. Weymouth, Daniel Meuer, Alexander Liebig, Andrea Donarini, Franz J. Giessibl

Summary: This study presents a method for the transition from graphite to diamond on the atomic scale and reveals the local rehybridization of the structure during this transition. The experimental observation of harmonics at specific thresholds and force reduction provides evidence for the existence of this transition.

NEW JOURNAL OF PHYSICS (2022)

Article Nanoscience & Nanotechnology

From a free electron gas to confined states: A mixed island of PTCDA and copper phthalocyanine on Ag(111)

Alfred J. Weymouth, Emily Roche, Franz J. Giessibl

Summary: This study investigates the effect of an electron donor on the electronic state by studying mixed islands of PTCDA and CuPc. The results show that the 2DEG state disappears and new states emerge under submonolayer coverage.

BEILSTEIN JOURNAL OF NANOTECHNOLOGY (2022)

Article Chemistry, Physical

A Next-Generation qPlus-Sensor-Based AFM Setup: Resolving Archaeal S-Layer Protein Structures in Air and Liquid

Theresa Seeholzer, Daniela Tarau, Lea Hollendonner, Andrea Auer, Reinhard Rachel, Dina Grohmann, Franz J. Giessibl, Alfred J. Weymouth

Summary: Researchers compared the S-layer proteins extracted from the archaeon Pyrobaculum aerophilium using atomic force microscopy (AFM) in liquid and ambient conditions with transmission electron microscopy (TEM) images under vacuum conditions. Improved AFM scanning and sample preparation methods allowed the observation of the crystalline structure of the S-layer samples.

JOURNAL OF PHYSICAL CHEMISTRY B (2023)

Article Materials Science, Multidisciplinary

Revealing buckling of an apparently flat monolayer of NaCl on Pt(111)

Alfred J. Weymouth, Mats Persson, Franz J. Giessibl

Summary: This study investigates the growth and structure of a thin insulating layer on Pt(111) by growing monolayer islands of NaCl and using scanning tunneling microscopy (STM) and atomic force microscopy (AFM). The STM images show a square lattice of Cl anions, while the AFM images only resolve approximately two-thirds of the Cl ions. Density functional theory (DFT) calculations reveal the bimodal distribution of the adsorption heights of the Cl anions above the surface, which can explain the AFM observations.

PHYSICAL REVIEW B (2022)

Article Physics, Multidisciplinary

Identifying the atomic configuration of the tip apex using STM and frequency-modulation AFM with CO on Pt(111)

O. Gretz, A. J. Weymouth, F. J. Giessibl

PHYSICAL REVIEW RESEARCH (2020)

Article Nanoscience & Nanotechnology

Analysis of Airborne Contamination on Transition Metal Dichalcogenides with Atomic Force Microscopy Revealing That Sulfur Is the Preferred Chalcogen Atom for Devices Made in Ambient Conditions

Korbinian Puerckhauer, Dominik Kirpal, Alfred J. Weymouth, Franz J. Giessibl

ACS APPLIED NANO MATERIALS (2019)

No Data Available