Optical constants of DC sputtering derived ITO, TiO 2 and TiO 2 :Nb thin films characterized by spectrophotometry and spectroscopic ellipsometry for optoelectronic devices
Optical constants of DC sputtering derived ITO, TiO 2 and TiO 2 :Nb thin films characterized by spectrophotometry and spectroscopic ellipsometry for optoelectronic devices
Authors
Keywords
Nanostructure, DC sputtering deposition, Transparent conductive oxides (TCOs), SEM, Spectrophotometry, Spectroscopic ellipsometry
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