Pre-Annealing Effect for Low-Temperature, Solution-Processed Indium Oxide Thin-Film Transistors

Title
Pre-Annealing Effect for Low-Temperature, Solution-Processed Indium Oxide Thin-Film Transistors
Authors
Keywords
-
Journal
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY
Volume 17, Issue 5, Pages 3293-3297
Publisher
American Scientific Publishers
Online
2017-02-28
DOI
10.1166/jnn.2017.14065

Ask authors/readers for more resources

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started