Separate Extraction of Densities of Interface and Bulk Trap States in High-Mobility ZnON Thin-Film Transistors

Published 2017 View Full Article

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Title
Separate Extraction of Densities of Interface and Bulk Trap States in High-Mobility ZnON Thin-Film Transistors
Authors
Keywords
-
Journal
Journal of Nanoelectronics and Optoelectronics
Volume 12, Issue 11, Pages 1263-1266
Publisher
American Scientific Publishers
Online
2018-02-06
DOI
10.1166/jno.2017.2111

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