Study of temperature sensitivity and impedance spectroscopy of zirconium oxynitride thin film thermistors

Title
Study of temperature sensitivity and impedance spectroscopy of zirconium oxynitride thin film thermistors
Authors
Keywords
Zirconium, Impedance Spectroscopy, Grain Boundary, Sapphire Substrate, Equivalent Circuit Model
Journal
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
Volume 28, Issue 13, Pages 9653-9657
Publisher
Springer Nature
Online
2017-04-05
DOI
10.1007/s10854-017-6715-y

Ask authors/readers for more resources

Reprint

Contact the author

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started