Monitoring of stress–strain evolution in thin films by reflection anisotropy spectroscopy and synchrotron X-ray diffraction
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Title
Monitoring of stress–strain evolution in thin films by reflection anisotropy spectroscopy and synchrotron X-ray diffraction
Authors
Keywords
Residual Stress, Digital Image Correlation, Twin Boundary, Bauschinger Effect, Vacancy Cluster
Journal
JOURNAL OF MATERIALS SCIENCE
Volume 52, Issue 11, Pages 6741-6753
Publisher
Springer Nature
Online
2017-02-28
DOI
10.1007/s10853-017-0909-9
References
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