Monitoring of stress–strain evolution in thin films by reflection anisotropy spectroscopy and synchrotron X-ray diffraction

Title
Monitoring of stress–strain evolution in thin films by reflection anisotropy spectroscopy and synchrotron X-ray diffraction
Authors
Keywords
Residual Stress, Digital Image Correlation, Twin Boundary, Bauschinger Effect, Vacancy Cluster
Journal
JOURNAL OF MATERIALS SCIENCE
Volume 52, Issue 11, Pages 6741-6753
Publisher
Springer Nature
Online
2017-02-28
DOI
10.1007/s10853-017-0909-9

Ask authors/readers for more resources

Reprint

Contact the author

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now