4.6 Article

Photoluminescence of CaxBa1-xGa2S4:Eu2+ solid solutions in wide excitation intensity and temperature intervals

Journal

JOURNAL OF LUMINESCENCE
Volume 181, Issue -, Pages 121-127

Publisher

ELSEVIER
DOI: 10.1016/j.jlumin.2016.09.017

Keywords

Chalcogenide semiconductor; Solid solution; Thiogallate; Europium; Photoluminescence

Categories

Funding

  1. Science Development Fund Under the President of the Republic of Azerbaijan [EIF-BGM-2-BRFTF-1-2012/2013-07/02/1]
  2. Belarusian Republican Foundation for Fundamental Research [F13AZ-020]

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The detailed investigation of CaxBa1-xGa2S4:Eu2+ solid solutions photoluminescence caused by 5d -> 4f electronic transitions in Eu2+ ions with x value from 0.1 to 0.9 in wide excitation intensity and temperature intervals was performed. It is shown that the change of x from 0.1 to 0.9 appears in a tune of emission spectrum peak position from 506 nm to 555 nm with minimal losses in the integral intensity not more than by 8%. The long wavelength shift of the emission spectra was determined as a result of the rise in the crystal field splitting energy of 5d-orbitals of Eu2+ ions in thiogallate host with increasing Ca content, which decreases the energy of the 5d -> 4f emission transition. The energies of the zero phonon line, red shift and the Stokes shift were defined for x value from 0.1 to 0.9. High temperature stability of the integral emission intensity with a decrease at only 25-40% depending on x value was found in the range from 10 K to 400 K. It was revealed that the increase in Ca content leads to a reduction of the temperature shift of the emission spectrum whereas at x >= 0.5 the shift is absent. The photoluminescence decay time constants were found to be from 305 ns to 470 ns for x value from 0.1 to 0.9. The extreme stability of the emission band shape and spectral position was found in a wide range of excitation power density from 10(-3) W/cm(2) to 10(7) W/cm(2) with a reversable emission efficiency droop only above 2 center dot 10(4) W/cm(2). (C) 2016 Elsevier B.V. All rights reserved.

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