First tests of a novel radiation hard CMOS sensor process for Depleted Monolithic Active Pixel Sensors

Published 2017 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
First tests of a novel radiation hard CMOS sensor process for Depleted Monolithic Active Pixel Sensors
Authors
Keywords
-
Journal
Journal of Instrumentation
Volume 12, Issue 06, Pages P06008-P06008
Publisher
IOP Publishing
Online
2017-06-07
DOI
10.1088/1748-0221/12/06/p06008

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.